35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Tutorial

Tutorial

Sunday, November 15, 2009

8:00 AM-8:10 AM

8:15 AM-4:30 PM


Technology-Specific FA
Session Chair: Mr. Dan J. Bodoh and Mr. Jeremy A. Walraven

8:30 AM-4:45 PM


Fault Isolation
Session Chair: Dr. James J. Demarest

10:30 AM-4:45 PM


Die and Defect Access
Session Chair: Dr. Chad Rue

Monday, November 16, 2009

8:00 AM-12:00 PM


Fault Isolation
Session Chair: Mr. Dan J. Bodoh

8:00 AM-2:15 PM


Technology-Specific FA
Session Chair: Mr. Richard Ross

8:15 AM-5:00 PM


Microscopy
Session Chair: Ms. Susan Li

1:45 PM-3:15 PM


The Periphery of FA
Session Chair: Dr. Sam Subramanian

2:15 PM-4:30 PM


Lab Management
Session Chair: Mr. Dan J. Bodoh

3:30 PM-5:45 PM


FIB
Session Chair: Mr. Kultaransingh (Bobby) Hooghan

4:30 PM-5:30 PM


The Periphery of FA
Session Chair: Dr. Sam Subramanian