35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Focused Ion Beam – A Design Repair/Fault Isolation Tool

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Focused Ion Beam – A Design Repair/Fault Isolation Tool

Monday, November 16, 2009: 3:30 PM
J1/J4 (San Jose McEnery Convention Center)
Mr. Steven B. Herschbein , IBM Systems & Technology, Hopewell Junction, NY
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