35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): FIB

Monday, November 16, 2009: 3:30 PM-5:45 PM

J1/J4 (San Jose McEnery Convention Center)

Session Chair:

Mr. Kultaransingh (Bobby) Hooghan

3:30 PM

Focused Ion Beam – A Design Repair/Fault Isolation Tool
Mr. Steven B. Herschbein, IBM Systems & Technology

5:15 PM

Focused Ion Beam – A Sample Preparation Tool
Mr. Kultaransingh (Bobby) Hooghan, Hooghan Consultancy & Services

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