35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Focused Ion Beam – A Sample Preparation Tool

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Focused Ion Beam – A Sample Preparation Tool

Monday, November 16, 2009: 5:15 PM
J1/J4 (San Jose McEnery Convention Center)
Mr. Kultaransingh (Bobby) Hooghan , Hooghan Consultancy & Services, TX
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