35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Optical and Infrared FA Microscopy

Monday, November 16, 2009: 3:30 PM

Meeting Room J3 (San Jose McEnery Convention Center)

Mr. John J. McDonald , Quantum Focus Instruments Corporation, Vista, CA

2009

Optical and Infrared FA Microscopy

John McDonald, Quantum Focus Instruments Corporation

An instrument designer discusses the design, use, and limitations for optics based failure analysis tools for circuits, with added emphasis on infrared microscopy. We begin with fundamental principles governing all microscopes and progress to exotic microscopes in the FA lab including polarized microscopes for liquid crystal hot spots, confocal microscopes, laser-based microscopes and infrared microscopes.

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