35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Emerging Trends in Failure Modes of Nanotechnology

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Emerging Trends in Failure Modes of Nanotechnology

Sunday, November 15, 2009: 3:15 PM
Meeting Room J2 (San Jose McEnery Convention Center)
Mr. Terence Kane , IBM, Hopewell Junction, NY
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