35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Magnetic Based Current Imaging for Fault Isolation in Die and Packages

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Magnetic Based Current Imaging for Fault Isolation in Die and Packages

Sunday, November 15, 2009: 2:00 PM
J1/J4 (San Jose McEnery Convention Center)
Dr. Lee A. Knauss , Booz Allen Hamilton, Annapolis Junction, MD
See more of: Fault Isolation
See more of: Tutorial