35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Fault Isolation

Sunday, November 15, 2009: 8:30 AM-4:45 PM

J1/J4 (San Jose McEnery Convention Center)

Session Chair:

Dr. James J. Demarest

8:30 AM

Beam-Based Defect Localization
Dr. Edward I. Cole, Sandia National laboratories

10:15 AM

Break

10:30 AM

Fundamentals of Laser Based FA Techniques
Dr. Aaron Falk, OptoMetrix, Inc

11:45 AM

Lunch

1:00 PM

LADA and SDL Techniques
Dr. Michael Bruce, AMD

2:00 PM

3:00 PM

Break

3:15 PM

Failure Localization with Active and Passive VC in FIB and SEM
Dr. Ruediger Rosenkranz, Fraunhofer Institute for Non-Destructive Testing

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