35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): A Practical Guide to using Scan Diagnosis for FA

Monday, November 16, 2009: 10:45 AM

J1/J4 (San Jose McEnery Convention Center)

Dr. Martin Keim , Mentor Graphics, Wilsonville, OR

Mr. Dan Bodoh , Freescale Semiconductor, Austin, TX

See more of: Fault Isolation
See more of: Tutorial