35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Fault Isolation

Monday, November 16, 2009: 8:00 AM-12:00 PM

J1/J4 (San Jose McEnery Convention Center)

Session Chair:

Mr. Dan J. Bodoh

8:00 AM

Photonic Localization Techniques
Prof. Christian Boit, TUB Berlin Institute of Technology

9:30 AM

FA Case Histories Using ATPG and Scan Diagnostics
Mr. Kendall Scott Wills, Independent Consultant

10:30 AM

Break

10:45 AM

A Practical Guide to using Scan Diagnosis for FA
Dr. Martin Keim, Mentor Graphics; Mr. Dan Bodoh, Freescale Semiconductor

See more of: Tutorial