35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): X-Ray & SAM Challenges for IC Package Inspection

Monday, November 16, 2009: 8:15 AM

Meeting Room J3 (San Jose McEnery Convention Center)

Dr. Thomas M. Moore , Omniprobe, Inc., Dallas, TX

Ms. Cheryl Hartfield , Omniprobe, Inc., Dallas, TX

Mrs. Gay Samuelson , Translational Genomic Institute, Phoenix, AZ

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