35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): The Pivotal Role of AFP Nanoscale Failure Analysis

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The Pivotal Role of AFP Nanoscale Failure Analysis

Monday, November 16, 2009: 9:30 AM
Meeting Room J2 (San Jose McEnery Convention Center)
Mr. Randal E. Mulder , Freescale Semiconductor, Inc., Austin, TX
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