35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Technology-Specific FA

Monday, November 16, 2009: 8:00 AM-2:15 PM

Meeting Room J2 (San Jose McEnery Convention Center)

Session Chair:

Mr. Richard Ross

8:00 AM

Failure Analysis of SRAM Memory
Dr. Sarma Gunturi, Texas Instruments, Inc.; Dr. Mark A. Dexter, Texas Instruments, Inc.

9:30 AM

The Pivotal Role of AFP Nanoscale Failure Analysis
Mr. Randal E. Mulder, Freescale Semiconductor, Inc.

10:30 AM

Break

11:00 AM

Failure Analysis of Present and Future DRAM Devices
Dr. Martin Versen, University of Applied Sciences Rosenheim

12:00 PM

Lunch

1:15 PM

Flash Memory Failure Analysis
Mr. Tyrone Tracy, Intel Corporation; Ms. Mary Shuller, Intel Corporation

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