35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Failure Localization with Active and Passive VC in FIB and SEM

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Failure Localization with Active and Passive VC in FIB and SEM

Sunday, November 15, 2009: 3:15 PM
J1/J4 (San Jose McEnery Convention Center)
Dr. Ruediger Rosenkranz , Fraunhofer Institute for Non-Destructive Testing, Dresden, Germany
See more of: Fault Isolation
See more of: Tutorial