35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Failure Analysis of SRAM Memory

Monday, November 16, 2009: 8:00 AM

Meeting Room J2 (San Jose McEnery Convention Center)

Dr. Sarma Gunturi , Texas Instruments, Inc., Dallas, TX

Dr. Mark A. Dexter , Texas Instruments, Inc., dallas, TX

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