35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Scanning Electron Microscopy

Monday, November 16, 2009: 1:00 PM

Meeting Room J3 (San Jose McEnery Convention Center)

Dr. William Vanderlinde , IARPA , College Park, MD

This tutorial covers the basic theory and practice of scanning electron microscopy. Practical ‘tips and tricks' are provided which will help in using the SEM effectively. 3-D stereo imaging is also discussed.

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