35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Flip Chip and Backside Analysis Techniques

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Flip Chip and Backside Analysis Techniques

Sunday, November 15, 2009: 1:45 PM
Meeting Room J3 (San Jose McEnery Convention Center)
Dr. Edward I. Cole , Sandia National laboratories, Albuquerque, NM
See more of: Die and Defect Access
See more of: Tutorial