35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): FA Case Histories Using ATPG and Scan Diagnostics

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FA Case Histories Using ATPG and Scan Diagnostics

Monday, November 16, 2009: 9:30 AM
J1/J4 (San Jose McEnery Convention Center)
Mr. Kendall Scott Wills , Independent Consultant, Sugar Land, TX
See more of: Fault Isolation
See more of: Tutorial