35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): The Periphery of FA

Monday, November 16, 2009: 4:30 PM-5:30 PM

Meeting Room J2 (San Jose McEnery Convention Center)

Session Chair:

Dr. Sam Subramanian

4:30 PM

Yield Basics for FA
Mr. Dave Albert, IBM; Mr. Tracy Myers, ON Semiconductor

See more of: Tutorial