S. Goh, Y. Chan, H. Tan, J. Ting, R. Chen, Z. Mai, J. Lam, L. Hsia, Global Foundries, Singapore, Singapore; C. M. Chua, J. Phang, SEMICAPS PTE LTD, Singapore, Singapore, Singapore

Summary: Much success has been proven on using such tester-driven techniques for soft failures, but little has been mentioned on hard defects incorporating conventional power alteration techniques, which typically present two main challenges in practice. First, in a typical test pattern, signals are toggling and they do not meet the requirement for constant voltage sourcing. Second, in most cases, noise is coupled in from ATE into the power amplifiers which distort signal images. In this paper, with a good understanding on ATE operations and its impact on VBA, we demonstrate that with proper test program control and noise management, tester driven power alteration techniques can be performed with sufficient sensitivity for potential functional hard defect localization.