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Tuesday, November 16, 2010 - 1:45 PM
3.2

Case Study in Fault Isolation of a Metal Short for Yield Enhancement

S. Ipek, D. Grosjean, Analog Devices, Wilmington, MA

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Summary: This is a case study in using a variety of techniques to find a metal-metal short that created a yield problems during the qual of transferring a part to a different fab. It illustrates the limitations of the FA techniques, but also how they can work together to bring success.