J. Plusquellic, University of New Mexico, Albuquerque, NM

Summary: A localization technique is investigated in the paper that analyze anomalies introduced by defects and/or Trojans in the measured IDDQs from these ports. The localization accuracy of the technique can be improved significantly through the use of calibration and additional information collected from simulation experiments. The method and model are validated using data collected from a set of 12 chips fabricated in a 65 nm process.