Failure Analysis Methodology on a Systematic Defect in an N+ Poly/NWELL Varactor in and RF Analog PLL Due to Implanter Charging Issue

Wednesday, November 14, 2012: 10:45 AM

102AB (Phoenix Convention Center)

Mr. Ghim Boon Ang , GLOBALFOUNDRIES Singapore, Singapore, Singapore

SiPing Zhao , GLOBALFOUNDRIES Singapore, Singapore, Singapore

See more of: Session 16: Case Studies I
See more of: Symposium

16.3 Failure Analysis Methodology on a Systematic Defect in an N+ Poly/NWELL Varactor in and RF Analog PLL Due to Implanter Charging Issue