38th International Symposium for Testing and Failure Analysis

Sunday, November 11, 2012

8:00 AM-11:00 AM


Package and Physical Analysis Challenges I
Session Chair: Mr. Ed Keyes and Mr. Christopher A. Pawlowicz

9:00 AM-12:00 PM


Electrical and Yield
Session Chair: Mr. Mark Jenkins

10:00 AM-3:00 PM


Microscopy I
Session Chair: Dr. Sam Subramanian and Mr. Randal E. Mulder

12:00 PM-6:00 PM


Fault Localization
Session Chair: Ms. Susan Li and Dr. Lihong Cao

1:00 PM-7:00 PM


Technology Specific FA
Session Chair: Mr. Jeremy A. Walraven and Mr. Mark Jenkins

3:00 PM-5:00 PM


Package and Physical Analysis Challenges II
Session Chair: Mr. Ed Keyes and Mr. Christopher A. Pawlowicz

Monday, November 12, 2012

8:00 AM-9:40 AM

9:55 AM-12:25 PM


1
Session 1: Emerging Concepts and Techniques
Session Chair: Dr. Michael Bruce and Mr. David Vallett

1:25 PM-3:05 PM


2
Session 2: Fault Isolation and Failure Analysis of TSV
Session Chair: Dr. Yan Li and Mr. Rudolf Schlangen

3
Session 3: Nanoprobing Techniques
Session Chair: Mr. John Sanders and Mr. Christian Hobert

3:20 PM-4:35 PM


4
Session 4: Fault Isolation and Failure Analysis of 3D Packages
Session Chair: Ms. Yan Li and Mr. Rudolf Schlangen

5
Session 5: Nanoprobing Applications
Session Chair: Mr. John Sanders and Mr. Christian Hobert

4:35 PM-6:00 PM


Nanoprobing User Group
Session Chair: Dr. Vijay Chowdhury and Mr. Randal E. Mulder

Panel Discussion
Session Chair: Dr. Zhiyong Wang

Tuesday, November 13, 2012

8:00 AM-9:40 AM


6
Session 6: Photon Based Techniques: An Understanding
Session Chair: Dr. Felix Beaudoin and Mr. Jim Colvin

7
Session 7: Rethinking the FA Process
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

9:30 AM-5:30 PM

9:55 AM-11:35 AM


8
Session 8: Photon Based Techniques: One Step Beyond
Session Chair: Dr. Felix Beaudoin and Mr. Jim Colvin

9
Session 9: Technology Specific Case Studies
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

1:05 PM-2:20 PM


11
Session 11: Alternative Energy
Session Chair: Dr. David W. Niles and Mr. Chris Richardson

1:05 PM-2:45 PM


10
Session 10: Photon Based Techniques: More Applications
Session Chair: Dr. Felix Beaudoin and Mr. Jim Colvin

3:00 PM-4:15 PM


13
Session 13: Defect Analysis
Session Chair: Mr. Terence Kane and Mr. Phil Kaszuba

3:00 PM-4:40 PM


12
Session 12: Improving Fault Isolation with Software
Session Chair: Mr. Mark E. Kimball and Felix Beaudoin

4:40 PM-5:40 PM


Contactless Fault Isolation User Group
Session Chair: Dr. Edward I. Cole and Mr. Frank Altmann

6:30 PM-7:30 PM

Wednesday, November 14, 2012

8:00 AM-9:00 AM


FIB Tutorial
Session Chair: Mr. Kultaransingh (Bobby) Hooghan

8:00 AM-10:05 AM


14
Session 14: Packaging and Assembly Analysis
Session Chair: Ms. Becky Holdford and Mr. Robert Champaign

9:00 AM-10:00 AM

9:30 AM-4:00 PM

10:20 AM-11:35 AM


16
Session 16: Case Studies I
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

10:20 AM-12:00 PM


15
Session 15: TEM Defect Detection
Session Chair: Mr. Terence Kane and Mr. Phil Kaszuba

12:00 PM-1:30 PM

1:30 PM-3:30 PM


24
Session 24: Exhibitor Dessert Reception and Poster Session
Session Chair: Dr. Martin Versen and Mr. David Grosjean

3:30 PM-4:45 PM


18
Session 18: Case Studies II
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

3:30 PM-5:35 PM


17
Session 17: Device Level Sample Prep
Session Chair: Mr. Bryan Tracy and Mr. Roger Alvis

Thursday, November 15, 2012

8:00 AM-9:00 AM


Fault Localization Tutorial
Session Chair: Ms. Susan Li and Dr. Lihong Cao

Lab Management Tutorial
Session Chair: Mr. Richard Ross

8:00 AM-10:00 AM


FIB Tutorials
Session Chair: Mr. Kultaransingh (Bobby) Hooghan and Mr. Jim Cargo

9:00 AM-10:00 AM


Electrical and Yield Tutorial
Session Chair: Mr. Mark Jenkins

Fault Localization Tutorial
Session Chair: Ms. Susan Li

10:15 AM-11:30 AM


19
Session 19: Counterfeit Electronics Detection and Mitigation
Session Chair: Mr. Bhanu P. Sood and Mr. Gary Shade

10:15 AM-11:55 AM


20
Session 20: Circuit Edit: Beam Interaction Studies
Session Chair: Mr. Dane Scott and Mr. Michael DiBattista

12:55 PM-2:10 PM


22
Session 22: Circuit Edit: Processing Strategies
Session Chair: Mr. Dane Scott and Mr. Michael DiBattista

12:55 PM-3:10 PM


21
Session 21: Chip Level Sample Prep
Session Chair: Mr. Bryan Tracy and Mr. Roger Alvis

2:10 PM-3:45 PM


Focused Ion Beam (FIB) User Group
Session Chair: Mr. Richard Livengood and Mr. Michael DiBattista

3:25 PM-5:00 PM


Sample Preparation User Group
Session Chair: Mr. Jacob E. Klein and Mr. Lucas Copland

3:25 PM-5:05 PM


23
Session 23: Test and Diagnosis
Session Chair: Mr. Geir Eide and Mr. Mark E. Kimball