38th International Symposium for Testing and Failure Analysis

Sunday, November 11, 2012

8:00 AM-11:00 AM

Package and Physical Analysis Challenges I
Session Chair: Mr. Ed Keyes and Mr. Christopher A. Pawlowicz

9:00 AM-12:00 PM

Electrical and Yield
Session Chair: Mr. Mark Jenkins

10:00 AM-3:00 PM

Microscopy I
Session Chair: Dr. Sam Subramanian and Mr. Randal E. Mulder

12:00 PM-6:00 PM

Fault Localization
Session Chair: Ms. Susan Li and Dr. Lihong Cao

1:00 PM-7:00 PM

Technology Specific FA
Session Chair: Mr. Jeremy A. Walraven and Mr. Mark Jenkins

3:00 PM-5:00 PM

Package and Physical Analysis Challenges II
Session Chair: Mr. Ed Keyes and Mr. Christopher A. Pawlowicz

Monday, November 12, 2012

8:00 AM-9:40 AM

ISTFA 2012 Opening Session

9:55 AM-12:25 PM

Session 1: Emerging Concepts and Techniques
Session Chair: Dr. Michael Bruce and Mr. David Vallett

1:25 PM-3:05 PM

Session 2: Fault Isolation and Failure Analysis of TSV
Session Chair: Dr. Yan Li and Mr. Rudolf Schlangen

Session 3: Nanoprobing Techniques
Session Chair: Mr. John Sanders and Mr. Christian Hobert

3:20 PM-4:35 PM

Session 4: Fault Isolation and Failure Analysis of 3D Packages
Session Chair: Ms. Yan Li and Mr. Rudolf Schlangen

Session 5: Nanoprobing Applications
Session Chair: Mr. John Sanders and Mr. Christian Hobert

4:35 PM-6:00 PM

Nanoprobing User Group
Session Chair: Dr. Vijay Chowdhury and Mr. Randal E. Mulder

Panel Discussion
Session Chair: Dr. Zhiyong Wang

Tuesday, November 13, 2012

8:00 AM-9:40 AM

Session 6: Photon Based Techniques: An Understanding
Session Chair: Dr. Felix Beaudoin and Mr. Jim Colvin

Session 7: Rethinking the FA Process
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

9:30 AM-5:30 PM

Expo Show Floor

9:55 AM-11:35 AM

Session 8: Photon Based Techniques: One Step Beyond
Session Chair: Dr. Felix Beaudoin and Mr. Jim Colvin

Session 9: Technology Specific Case Studies
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

1:05 PM-2:20 PM

Session 11: Alternative Energy
Session Chair: Dr. David W. Niles and Mr. Chris Richardson

1:05 PM-2:45 PM

Session 10: Photon Based Techniques: More Applications
Session Chair: Dr. Felix Beaudoin and Mr. Jim Colvin

3:00 PM-4:15 PM

Session 13: Defect Analysis
Session Chair: Mr. Terence Kane and Mr. Phil Kaszuba

3:00 PM-4:40 PM

Session 12: Improving Fault Isolation with Software
Session Chair: Mr. Mark E. Kimball and Felix Beaudoin

4:40 PM-5:40 PM

Contactless Fault Isolation User Group
Session Chair: Dr. Edward I. Cole and Mr. Frank Altmann

6:30 PM-7:30 PM

Accepted Movie Submissions

Wednesday, November 14, 2012

8:00 AM-9:00 AM

FIB Tutorial
Session Chair: Mr. Kultaransingh (Bobby) Hooghan

8:00 AM-10:05 AM

Session 14: Packaging and Assembly Analysis
Session Chair: Ms. Becky Holdford and Mr. Robert Champaign

9:00 AM-10:00 AM

Microscopy II Tutorial

9:30 AM-4:00 PM

Expo Show Floor

10:20 AM-11:35 AM

Session 16: Case Studies I
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

10:20 AM-12:00 PM

Session 15: TEM Defect Detection
Session Chair: Mr. Terence Kane and Mr. Phil Kaszuba

12:00 PM-1:30 PM

EDFAS General Membership Meeting & Networking Luncheon

1:30 PM-3:30 PM

Session 24: Exhibitor Dessert Reception and Poster Session
Session Chair: Dr. Martin Versen and Mr. David Grosjean

3:30 PM-4:45 PM

Session 18: Case Studies II
Session Chair: Ms. Rose Ring and Mr. David L. Burgess

3:30 PM-5:35 PM

Session 17: Device Level Sample Prep
Session Chair: Mr. Bryan Tracy and Mr. Roger Alvis

Thursday, November 15, 2012

8:00 AM-9:00 AM

Fault Localization Tutorial
Session Chair: Ms. Susan Li and Dr. Lihong Cao

Lab Management Tutorial
Session Chair: Mr. Richard Ross

8:00 AM-10:00 AM

FIB Tutorials
Session Chair: Mr. Kultaransingh (Bobby) Hooghan and Mr. Jim Cargo

9:00 AM-10:00 AM

Electrical and Yield Tutorial
Session Chair: Mr. Mark Jenkins

Fault Localization Tutorial
Session Chair: Ms. Susan Li

10:15 AM-11:30 AM

Session 19: Counterfeit Electronics Detection and Mitigation
Session Chair: Mr. Bhanu P. Sood and Mr. Gary Shade

10:15 AM-11:55 AM

Session 20: Circuit Edit: Beam Interaction Studies
Session Chair: Mr. Dane Scott and Mr. Michael DiBattista

12:55 PM-2:10 PM

Session 22: Circuit Edit: Processing Strategies
Session Chair: Mr. Dane Scott and Mr. Michael DiBattista

12:55 PM-3:10 PM

Session 21: Chip Level Sample Prep
Session Chair: Mr. Bryan Tracy and Mr. Roger Alvis

2:10 PM-3:45 PM

Focused Ion Beam (FIB) User Group
Session Chair: Mr. Richard Livengood and Mr. Michael DiBattista

3:25 PM-5:00 PM

Sample Preparation User Group
Session Chair: Mr. Jacob E. Klein and Mr. Lucas Copland

3:25 PM-5:05 PM

Session 23: Test and Diagnosis
Session Chair: Mr. Geir Eide and Mr. Mark E. Kimball