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24.9
A Practical Method for Trace Exposure and Roughness Measurements and Implementation in High Speed Package Design
Wednesday, November 14, 2012
West Hall 1 (Phoenix Convention Center)
Mrs. Valentina Korchnoy
,
Intel Israel (74) Ltd, Haifa, Israel
Jacov Brener
,
Intel Israel (74) Ltd, Jerusalem, Israel
Ms. Svetlana Leboeuf
,
Intel Israel (74) Ltd, Haifa, Israel
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Session 24: Exhibitor Dessert Reception and Poster Session
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Symposium
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