Scan Chain Bridge Defect on a 28nm Technology Node Circuit, Optical Techniques Localization Using Dynamic Power Supplies

Wednesday, November 14, 2012

West Hall 1 (Phoenix Convention Center)

Mr. Guillaume Celi , ST Microelectronics, Crolles, France

Mr. Thierry Parrassin , ST Microelectronics, Crolles, France

Mr. Emmanuel Petit , ST Microelectronics, Crolles, France

Mr. Yann Mousseau , ST Microelectronics, Crolles, France

Sylvain Dudit , ST Microelectronics, Crolles, France

24.13 Scan Chain Bridge Defect on a 28nm Technology Node Circuit, Optical Techniques Localization Using Dynamic Power Supplies