Laser Voltage Probing in Failure Analysis of Advanced Integrated Circuits on SOI

Monday, November 12, 2012: 9:05 AM

106ABC (Phoenix Convention Center)

Mr. Venkat Ravikumar , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore

R. Wampler , Advanced Micro Devices Inc., Austin, TX

M.Y. Ho , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore

J. Christensen , Advanced Micro Devices Inc., Austin, TX

S.L. Phoa , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore

See more of: ISTFA 2012 Opening Session
See more of: Symposium

.1 Laser Voltage Probing in Failure Analysis of Advanced Integrated Circuits on SOI