Dr. Zhigang Song

IBM
2070 Route 52
Hopewell Junction, NY
USA NY 12533

Papers:
3.1 Early Inline Detection of Systematic Defects Using ATPG & Commonality Analysis On Product-Like Logic Yield Learning Vehicle 5.3 Failure Analysis for SRAM Logic Type Failures 9.2 Advanced Fault Localization Through Use of Tester Based Diagnostics With Lvi, Lvp, CPA and PEM