3.1
Early Inline Detection of Systematic Defects Using ATPG & Commonality Analysis On Product-Like Logic Yield Learning Vehicle

Monday, November 4, 2013: 1:05 PM
Meeting Room 230B (San Jose McEnery Convention Center)
Dr. Felix Beaudoin , IBM, Hopewell Junction, NY
Dr. Zhigang Song , IBM, Hopewell Junction, NY
Mr. Stephen Lucarini , IBM, Hopewell Junction, NY
Mr. Thomas F. Mechler , IBM, Hopewell Junction, NY
Mr. Stephen Wu , IBM, Hopewell Junction, NY
Mr. Todd Cohen , IBM, Hopewell Junction, NY
Dr. Mark Lagus , IBM, Hopewell Junction, NY
Mr. Dieter Wendel , IBM, Boeblingen, Germany
Mr. Bruno Spruth , IBM, Boeblingen, Germany
Mr. Kevin Stanley , IBM, Essex Junction, VT
Mr. David Bogdan , IBM, Essex Junction, VT

See more of: Session 3: Test and Diagnostics
See more of: Symposium