39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Rudolf A. Sia

Analog Devices Inc.
Worldwide Product Analysis
Gateway Business Park, Javalera
Gen. Trias Philippines 4107

Papers:
10.16 Enabling Scanning Acoustic Microscopy Inspection of Materials Underneath the Chamfer of the Package