Mr. Stephane Barbeau

Failure Analysis Engineer
IBM Microelectronics
23, Boul. de l'Aeroport
Bromont, QC
Canada J2L 1A3

Papers:
6.1 Electro Optical Terahertz Pulse Reflectometry - a Fast and Highly Accurate Non-Destructive Fault Isolation Technique for 3D Flip Chip Packages