39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Dr. Stephane Alves

Freescale Semiconducteurs France SAS, Toulouse
Quality
Avenue du Général Eisenhower
134
Toulouse France 31023

Papers:
12.3 Fault Localization of Metal Defects With Si-CCD Camera in Analog Device Functional Failure