39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mrs. Marlyn C Grancapal

Product Planner
Analog Devices, Inc - Gen Trias
Product Analysis
Gateway Business Park, Brgy Javalera
Gen Trias
Cavite Philippines 4107

Papers:
10.16 Enabling Scanning Acoustic Microscopy Inspection of Materials Underneath the Chamfer of the Package