39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mr. Naoki Seimiya

Seinior Supervisor
Marubun Corporation
SALES Dept.2
8-1, Nihonbashi Odenmacho
Chuo-ku, Tokyo Japan 103-8577

Papers:
6.3 Nondestructive Analysis Solution Using Combination of Lock-in Thermography(LIT) and Advanced 3D Oblique X-Ray CT Technology