39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mr. Dan J. Bodoh

Freescale Semiconductor
Silicon Systems Diagnostic Center
6501 William Cannon Drive West
Austin, TX
USA 78735

Papers:
1.5 Two-Photon-Absorption-Enhanced Laser-Assisted Device Alteration and Single-Event Upsets in 28nm Silicon Integrated Circuits