1.5
Two-Photon-Absorption-Enhanced Laser-Assisted Device Alteration and Single-Event Upsets in 28nm Silicon Integrated Circuits
Two-Photon-Absorption-Enhanced Laser-Assisted Device Alteration and Single-Event Upsets in 28nm Silicon Integrated Circuits
Monday, November 4, 2013: 11:40 AM
Meeting Room 230AB (San Jose McEnery Convention Center)