Dr. Guofeng You

Phd
GLOBALFOUNDRIES
Technology Development- New Technology Prototyping
60 Woodlands Industrial Park D Street 2
Singapore Singapore 738406

Papers:
3.2 Evolution of Wafer Level Tester- Based Diagnostic System: More Than Just a Dynamic Electrical Fault Isolation Tool 3.4 Leveraging Root Cause Deconvolution Analysis for Logic Yield Ramping