3.2
Evolution of Wafer Level Tester- Based Diagnostic System: More Than Just a Dynamic Electrical Fault Isolation Tool

Monday, November 4, 2013: 1:30 PM
Meeting Room 230B (San Jose McEnery Convention Center)
Dr. SH Goh , GLOBALFOUNDRIES, Singapore, Singapore
Dr. Guofeng You , GLOBALFOUNDRIES, Singapore, Singapore
Mr. Boon Lian Yeoh , GLOBALFOUNDRIES, Singapore, Singapore
YH Chan , Global Foundries, Singapore, Singapore
CP Yap , GLOBALFOUNDRIES, Singapore, Singapore
Jeffrey Lam , Globalfoundries Singapore Pte. Ltd., Singapore, Singapore

See more of: Session 3: Test and Diagnostics
See more of: Symposium