39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mr. Simon Gousseau

CEA, Leti, MINATEC Campus
MINATEC Campus
17 rue des martyrs
Cedex 9
Grenoble France 38054

Papers:
5.6 First in Operando SEM Observation of Electromigration-Induced Voids in TSV Structure