39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Dr. Pierre MONTMITONNET

PhD
MINES-ParisTech CEMEF
1 rue Claude Daunesse
CS 10207
Sophia Antipolis France 06904

Papers:
5.6 First in Operando SEM Observation of Electromigration-Induced Voids in TSV Structure