39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mr. Robert Anderson

Manager
Silicon Labs
Device Analysis Lab
400 W. Cesar Chavez
Austin, TX
USA 78701

Papers:
10.22 A Simple Technique for Removing the Entire Metallization Stack for Sub 100nm Device Technologies