Dr. Edward I. Cole Jr.

Senior Scientist
Sandia National Laboratories
PO Box 5800, MS 1072
Albuquerque, NM
USA 84185-1072

Papers:
12.4 Novel Defect Detection Using Laser-Based Imaging and TIVA With a Visible Laser Flip-Chip and Backside Analysis Techniques Beam-Based Defect Localization