39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
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Flip-Chip and Backside Analysis Techniques
Sunday, November 3, 2013: 12:15 PM
Meeting Room 230A (San Jose McEnery Convention Center)
Dr. Edward I. Cole Jr.
,
Sandia National Laboratories, Albuquerque, NM
Dr. Daniel Barton
,
Sandia National Laboratories, Albuquerque, NM
Ms. Karoline Bernhard-Hofer
,
Infineon, Regensburg, Germany
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