39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Prof. Dean Lewis

IMS laboratory, University of Bordeaux
351 cours de la Libération
Talence France 33405

Papers:
9.1 Laser Voltage Imaging and Its Derivatives, Efficient Techniques to Address Defect On 28nm Technology