Mr. Frank Altmann

Fraunhofer Institute for Mechanics of Materials
Center for Applied Microstructure Diagnostics (CAM)
Walter-Huelse-Strasse 1
Halle Germany D-06120

Papers:
Localization of Weak Points in Thin Dielectric Layers By Electron Beam Absorbed Current (EBAC) Imaging Efficient Non-destructive 3D Defect Localization by Lock-in Thermography utilizing Multi Harmonics Analysis Defect localization by Lock-in-Thermography