40th International Symposium for Testing and Failure Analysis (ISTFA 2014)

Sunday, November 9, 2014

8:00 AM-9:00 AM

Chip Scale Packaging and Its Failure Analysis Challenges Tutorial
Session Chair: Mr. Jake E. Klein and Mr. Robert Champaign

Yield Basics for FA Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

9:00 AM-10:00 AM

Beam-Based Defect Localization Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

SAM vs X-RAY Tutorial
Session Chair: Mr. Jake E. Klein and Mr. Robert Champaign

Testing Small Technology Nodes in 2, 2.5, 3, and 5.5D Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

10:15 AM-11:15 AM

Flip-Chip and Backside Techniques Tutorial
Session Chair: Mr. Jake E. Klein and Mr. Robert Champaign

Photonic Localization Techniques Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

The Role of Nanoprobing in Yield and Failure Analysis Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

11:15 AM-12:15 PM

Laser Induced Techniques for Microelectronic Failure Analysis: SDL and LADA Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

Test Fundamentals and Implementation of Wafer Level Tester-Based Failure Analysis Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

12:15 PM-1:15 PM

Defect localization by Lock-in-Thermography Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

1:15 PM-2:15 PM

Scanning Electron Microscopy Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

2:15 PM-3:15 PM

Emerging Failure Modes of Advanced Technology Tutorial
Session Chair: Mr. Jeremy A. Walraven and Mr. Chris Richardson

Magnetic Imaging for Die and Package Fault Isolation Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

Transmission Electron Microscopy Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

3:15 PM-4:15 PM

FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

Failure Anamnesis (be)for(e) Failure Analysis Tutorial
Session Chair: Mr. Jeremy A. Walraven and Mr. Chris Richardson

Ultra-High Resolution in the SEM Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

4:30 PM-5:30 PM

Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

5:30 PM-6:30 PM

Materials Characterization for Failure Analysis Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

Monday, November 10, 2014

8:00 AM-9:40 AM

Plenary Session
Session Chair: Mr. Dan Bodoh

9:55 AM-11:15 AM

Emerging Concepts and Techniques
Session Chair: Dr. Michael Bruce and Dr. Huimeng Wu

11:15 AM-12:05 PM

Novel Research-Level Techniques and Concepts
Session Chair: Dr. Michael Bruce and Dr. Huimeng Wu

1:00 PM-1:25 PM

Detecting Counterfeit Devices
Session Chair: Dr. Zhigang Song

1:00 PM-2:40 PM

3D Packages I
Session Chair: Mr. Frank Altmann and Dr. Yan Li

1:25 PM-2:40 PM

Photon-Based Techniques I
Session Chair: Dr. Frank Zachariasse and Dr. Herve Deslandes

2:50 PM-4:05 PM

Packaging and Assembly Analysis I
Session Chair: Dr. Lihong Cao

Photon-Based Techniques II
Session Chair: Dr. Frank Zachariasse and Dr. Herve Deslandes

4:05 PM-6:00 PM

Contactless User Group

7:00 PM-9:00 PM

Social Event

Tuesday, November 11, 2014

8:00 AM-9:15 AM

Microscopy I
Session Chair: Mr. Carl Nail

8:00 AM-9:40 AM

3D Packages II
Session Chair: Mr. Frank Altmann and Dr. Yan Li

9:55 AM-12:00 PM

Electrical Characterization and Nanoprobing
Session Chair: Dr. Stefan B. Kaemmer and Mr. Izak Kapilevich

Packaging and Assembly Analysis II
Session Chair: Dr. Lihong Cao

12:20 PM-2:20 PM

Nanoprobing User Group

2:35 PM-3:50 PM

Packaging and Assembly Analysis III
Session Chair: Dr. Lihong Cao

2:35 PM-4:40 PM

Case Studies and the Failure Analysis Process I
Session Chair: Dr. Zhigang Song and Prof. Peter Jacob

4:00 PM-6:00 PM

Expo Networking Reception

Wednesday, November 12, 2014

8:00 AM-10:00 AM

Oil & Gas Microelectronics Failure Analysis: Methodologies and Selected Case Studies Tutorial
Session Chair: Mr. Jeremy A. Walraven

9:00 AM-10:00 AM

Fundamentals of Laser Signal Injection Microscopy
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

10:15 AM-12:15 PM

Panel Discussion: System to Component Level Failure Analysis in Space & Oil industries
Session Chair: Dr. Felix Beaudoin

1:30 PM-3:30 PM

Posters
Session Chair: Dr. Martin Versen and Mr. David Grosjean

3:30 PM-4:20 PM

Circuit Edit
Session Chair: Mr. Dane Scott and Dr. Michael DiBattista

3:30 PM-5:35 PM

Sample Preparation and Device Deprocessing I
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

4:20 PM-6:00 PM

Microscopy II
Session Chair: Mr. Carl Nail

Thursday, November 13, 2014

8:00 AM-9:40 AM

Case Studies and the Failure Analysis Process II
Session Chair: Dr. Zhigang Song and Prof. Peter Jacob

Sample Preparation and Device Deprocessing II
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

9:50 AM-11:30 AM

Defect Characterization and Metrology
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

9:50 AM-11:55 AM

Sample Preparation and Device Deprocessing III
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

12:20 PM-2:20 PM

Sample Prep User Group

2:30 PM-3:20 PM

Sample Preparation and Device Deprocessing IV
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

2:30 PM-3:45 PM

Software-Based Techniques, Test, Diagnosis, and Yield
Session Chair: Mr. Geir Eide and Mr. Mark E. Kimball

3:45 PM-5:45 PM

FIB User Group