40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Mr. Steve Brockett

Director
TriQuint Semiconductor, Inc.
Quality and Reliability
2300 NE Brookwood Parkway
Hillsboro, OR
USA 97124

Papers:
Temperature-Dependent Logic Failure in a GaAs Power Amplifier-Duplexer Module Caused by a Subtle Parasitic Schottky Diode Determination of the Source of an Electrical Over Stress Event to a Digital Variable Gain Amplifier Module

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General Information

November 09 - 13, 2014


Houston, TX