40th International Symposium for Testing and Failure Analysis (ISTFA 2014)

November 09 - 13, 2014

Mr. Dan J. Bodoh

Freescale Semiconductor
New Product and Technology Diagnostic Center
6501 William Cannon Drive West
Austin, TX
USA 78735

Papers:
The Role of Free Carrier Absorption in LADA Root Cause Analysis Techniques Using Picosecond Time Resolved LADA