Mr. Michél Simon-Najasek
Mr. Michél Simon-Najasek
Fraunhofer Institute for Mechanics of Materials
Center for Applied Microstructure Diagnostics (CAM)
Walter-Huelse-Strasse 1
Halle
Germany
D-06120
Papers:
Localization of Weak Points in Thin Dielectric Layers By Electron Beam Absorbed Current (EBAC) Imaging