41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Mr. Alex Krechmer

FIB Engineer
Techinsights
R&D
3000 Solandt rd.
Ottawa,, ON
Canada K2K2X2

Papers:
6.2 Circuit Tracing on an Integrated Circuit using FIB Passive Voltage Contrast effect CPU Thermal Video Capture